Bell Laboratories, Murray Hill, NJ (ret), Portland State University, Portland, OR, and ERS Co., Los Altos, CA, USA and Bordeaux Univ., Bordeaux, France
*Corresponding Author: E Suhir, Bell Laboratories, Murray Hill, NJ (ret), Portland State University, Portland, OR, and ERS Co., Los Altos, CA, USA and Bordeaux Univ., Bordeaux, France.
Received: June 28, 2023; Published: July 01, 2023
Temperature cycling, the most widespread accelerated test vehicle in experimental reliability physics today, is costly, time- and labor consuming, but, most importantly, can result in misleading information, because electronic and photonics materials’ properties and performance are temperature dependent and temperature sensitive, and reliability testing, especially if it is of failure-oriented type (see, e.g., ), is conducted in a temperature range, which is much wider than what the product will most likely encounter in actual operation conditions.
Citation: E Suhir. “Reliability Physics of IC Products: Is Temperature Cycling an Adequate Accelerated Test Vehicle?". Acta Scientific Applied Physics 3.8 (2023): 01-02.
Copyright: © 2023 E Suhir. This is an open-access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.