Bell Laboratories, Physical Sciences and Engineering Research Division, Murray Hill, NJ, USA
*Corresponding Author: E Suhir, Bell Laboratories, Physical Sciences and Engineering Research Division, Murray Hill, NJ, USA.
Received: April 15, 2023; Published: June 01, 2023
Understanding the reliability physics is critical for making a viable “high-tech” device into a reliable product, isn’t it? On the other hand, it is, as is known, the properly designed, carefully conducted and correctly interpreted accelerated testing that is the “supreme and final judge” of the product’s reliability. An highly focused and highly cost effective failure-oriented-accelerated-testing (FOAT) [1,2] suggested about a decade ago as an experimental basis of the novel probabilistic design for reliability (PDfR) concept  is intended to be carried out at the design stage of a new electronic, photonic, MEMS and MOEMS (optical MEMS) technology and when high operational reliability (like the one required, e.g., for aerospace, military, or long-haul communication applications), especially when instrumentation and human performance contribute jointly to the outcome of an aerospace or a military undertaking , is a must.
Citation: E Suhir. “Failure Oriented Accelerated Testing and its Role in Understanding and Assuring Reliability of Electronic and Photonic Products". Acta Scientific Applied Physics 3.6 (2023): 01-02.
Copyright: © 2023 E Suhir. This is an open-access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.