E Suhir*
Bell Laboratories, Murray Hill, NJ, USA (ret); Portland State University, Portland, OR, USA
*Corresponding Author: E Suhir, Bell Laboratories, Murray Hill, NJ, USA (ret); Portland State University, Portland, OR, USA.
Received: February 17, 2023; Published: March 01, 2023
Ability to understand the physics of failure and predict-and-prevent failures in electronic materials, devices, packages and systems is of obvious importance, especially for highly demanding applications, such as, aerospace, long-haul communications or military. The multi-parametric Boltzmann–Arrhenius–Zhurkov (BAZ) equation [1,2] introduced about a decade ago enables quantifying the probability of failure and the corresponding lifetime of an electronic or a photonic product by interpreting the results of a specially designed, thoroughly conducted and carefully interpreted highly-cost-effective and highly-focused failure-oriented accelerated testing (FOAT) [3,4].
Citation: E Suhir. “Boltzmann-Arrhenius-Zhurkov (BAZ) Constitutive Equation Enables Quantifying Reliability Physics in Electronics Engineering". Acta Scientific Applied Physics 3.4 (2023): 01.
Copyright: © 2023 E Suhir. This is an open-access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.