E Suhir*

Bell Laboratories, Murray Hill, NJ, USA (ret); Portland State University, Portland, OR, USA

*Corresponding Author: E Suhir, Bell Laboratories, Murray Hill, NJ, USA (ret); Portland State University, Portland, OR, USA.

Received: February 17, 2023; Published: March 01, 2023

Abstract

Ability to understand the physics of failure and predict-and-prevent failures in electronic materials, devices, packages and systems is of obvious importance, especially for highly demanding applications, such as, aerospace, long-haul communications or military. The multi-parametric Boltzmann–Arrhenius–Zhurkov (BAZ) equation [1,2] introduced about a decade ago enables quantifying the probability of failure and the corresponding lifetime of an electronic or a photonic product by interpreting the results of a specially designed, thoroughly conducted and carefully interpreted highly-cost-effective and highly-focused failure-oriented accelerated testing (FOAT) [3,4].

References

1. Suhir E and Kang S. “Boltzmann-Arrhenius-Zhurkov (BAZ) Model in Physics-of-Materials Problems”. Modern Physics Letters B (MPLB) 27 (2013).
2. Suhir E and Stamenkovic Z. “Using Yield to Predict Long-Term Reliability of Integrated Circuit (IC) Devices: Application of Boltzmann-Arrhenius-Zhurkov (BAZ) Model”. Solid-State Electronics 164 (2020).
3. Suhir E. “HALT, FOAT and Their Role in Making a Viable Device into a Reliable Product”. IEEE/AIAA Aerospace Conf., March 1-8, Big Sky, Montana, Paper #2050, (2014).
4. E Suhir. “Failure-Oriented-Accelerated-Testing (FOAT) and Its Role in Making a Viable IC Package into a Reliable Product”. Circuits Assembly, July (2013).
5. E Suhir. “Probabilistic Design for Reliability of Electronic Materials, Assemblies, Packages and Systems: Attributes, Challenges, Pitfalls”. Plenary Lecture, MMCTSE 2017, Cambridge, UK, Feb. (2017): 24-26.
6. E Suhir. “To Burn-in, or not to Burn-in: That’s the Question”. Aerospace3 (2019).
7. ”. International Journal of Heat and Mass Transfer11-12 (2010): 2477-2483.

Citation

Citation: E Suhir. “Boltzmann-Arrhenius-Zhurkov (BAZ) Constitutive Equation Enables Quantifying Reliability Physics in Electronics Engineering". Acta Scientific Applied Physics 3.4 (2023): 01.

Copyright

Copyright: © 2023 E Suhir. This is an open-access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.