Acta Scientific Applied Physics

Editorial Volume 3 Issue 4

Boltzmann-Arrhenius-Zhurkov (BAZ) Constitutive Equation Enables Quantifying Reliability Physics in Electronics Engineering

E Suhir*

Bell Laboratories, Murray Hill, NJ, USA (ret); Portland State University, Portland, OR, USA

*Corresponding Author: E Suhir, Bell Laboratories, Murray Hill, NJ, USA (ret); Portland State University, Portland, OR, USA.

Received: February 17, 2023; Published: March 01, 2023


Ability to understand the physics of failure and predict-and-prevent failures in electronic materials, devices, packages and systems is of obvious importance, especially for highly demanding applications, such as, aerospace, long-haul communications or military. The multi-parametric Boltzmann–Arrhenius–Zhurkov (BAZ) equation [1,2] introduced about a decade ago enables quantifying the probability of failure and the corresponding lifetime of an electronic or a photonic product by interpreting the results of a specially designed, thoroughly conducted and carefully interpreted highly-cost-effective and highly-focused failure-oriented accelerated testing (FOAT) [3,4].


  1. Suhir E and Kang S. “Boltzmann-Arrhenius-Zhurkov (BAZ) Model in Physics-of-Materials Problems”. Modern Physics Letters B (MPLB) 27 (2013).
  2. Suhir E and Stamenkovic Z. “Using Yield to Predict Long-Term Reliability of Integrated Circuit (IC) Devices: Application of Boltzmann-Arrhenius-Zhurkov (BAZ) Model”. Solid-State Electronics 164 (2020).
  3. Suhir E. “HALT, FOAT and Their Role in Making a Viable Device into a Reliable Product”. IEEE/AIAA Aerospace Conf., March 1-8, Big Sky, Montana, Paper #2050, (2014).
  4. E Suhir. “Failure-Oriented-Accelerated-Testing (FOAT) and Its Role in Making a Viable IC Package into a Reliable Product”. Circuits Assembly, July (2013).
  5. E Suhir. “Probabilistic Design for Reliability of Electronic Materials, Assemblies, Packages and Systems: Attributes, Challenges, Pitfalls”. Plenary Lecture, MMCTSE 2017, Cambridge, UK, Feb. (2017): 24-26.
  6. E Suhir. “To Burn-in, or not to Burn-in: That’s the Question”. Aerospace3 (2019).
  7. ”. International Journal of Heat and Mass Transfer11-12 (2010): 2477-2483.


Citation: E Suhir. “Boltzmann-Arrhenius-Zhurkov (BAZ) Constitutive Equation Enables Quantifying Reliability Physics in Electronics Engineering". Acta Scientific Applied Physics 3.4 (2023): 01.


Copyright: © 2023 E Suhir. This is an open-access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.

News and Events

  • Certification for Review
    Acta Scientific certifies the Editors/reviewers for their review done towards the assigned articles of the respective journals.
  • Submission Timeline for Upcoming Issue
    The last date for submission of articles for regular Issues is May 30, 2024.
  • Publication Certificate
    Authors will be issued a "Publication Certificate" as a mark of appreciation for publishing their work.
  • Best Article of the Issue
    The Editors will elect one Best Article after each issue release. The authors of this article will be provided with a certificate of "Best Article of the Issue"
  • Welcoming Article Submission
    Acta Scientific delightfully welcomes active researchers for submission of articles towards the upcoming issue of respective journals.

Contact US