Acta Scientific Applied Physics

Editorial Volume 3 Issue 3

pdf/ASAP
Reliability Physics of IC Products: Probabilistic Approach

E Suhir*

Bell Laboratories, Murray Hill, NJ (ret), Portland State University, Portland, OR, and ERS Co., Los Altos, CA, USA

*Corresponding Author: E Suhir, Bell Laboratories, Murray Hill, NJ (ret), Portland State University, Portland, OR, and ERS Co., Los Altos, CA, USA.

Received: January 27, 2023; Published: February 01, 2023

Abstract

The reliability of the future electronics and photonics products, including the micro-electro-mechanical- systems (MEMS) and MOEMS (optical MEMS), will depend, first of all, on the performance of their materials, devices and packages.

References

  1. E Suhir. “Microelectronics and Photonics – the Future”. Microelectronics Journal11-12 (2000).
  2. E Suhir., et al. "Highly Accelerated Life Testing (HALT), Failure Oriented Accelerated Testing (FOAT), and Their Role in Making a Viable Device into a Reliable Product”. 2014 IEEE Aerospace Conf., Big Sky, Montana, March (2014).
  3. E Suhir. “Probabilistic Design for Reliability”. Chip Scale Reviews6 (2010).
  4. E Suhir. “Probabilistic Design for Reliability of Electronic Materials, Assemblies, Packages and Systems: Attributes, Challenges, Pitfalls”. Plenary Lecture, MMCTSE 2017, Cambridge, UK, Feb. 24-26, (2017).
  5. E Suhir. "Failure-Oriented-Accelerated-Testing (FOAT) and Its Role in Making a Viable IC Package into a Reliable Product”. Circuits Assembly, July (2013).
  6. E Suhir and S Kang. “Boltzmann-Arrhenius-Zhurkov (BAZ) Model in Physics-of-Materials Problems”. Modern Physics Letters B (MPLB) 27 (2013).
  7. E Suhir. “To Burn-in, or not to Burn-in: That’s the Question”. Aerospace 3 (2019).
  8. E Suhir. "Analytical Bathtub Curve with Application to Electron Device Reliability”. Journal of Materials Science: Materials in Electronics9 (2015).
  9. E Suhir. "Predictive Modeling is a Powerful Means to Prevent Thermal Stress Failures in Electronics and Photonics”. Chip Scale Reviews4 (2011).

Citation

Citation: E Suhir. “Reliability Physics of IC Products: Probabilistic Approach". Acta Scientific Applied Physics 3.3 (2023): 01-02.

Copyright

Copyright: © 2023 E Suhir. This is an open-access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.



News and Events


Contact US





//