E Suhir*

Bell Laboratories, Murray Hill, NJ (ret), Portland State University, Portland, OR, and ERS Co., Los Altos, CA, USA

*Corresponding Author: E Suhir, Bell Laboratories, Murray Hill, NJ (ret), Portland State University, Portland, OR, and ERS Co., Los Altos, CA, USA.

Received: January 27, 2023; Published: February 01, 2023

Abstract

The reliability of the future electronics and photonics products, including the micro-electro-mechanical- systems (MEMS) and MOEMS (optical MEMS), will depend, first of all, on the performance of their materials, devices and packages.

References

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Citation

Citation: E Suhir. “Reliability Physics of IC Products: Probabilistic Approach". Acta Scientific Applied Physics 3.3 (2023): 01-02.

Copyright

Copyright: © 2023 E Suhir. This is an open-access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.