Acta Scientific Applied Physics

Review Article Volume 2 Issue 12

Failure-Oriented-Accelerated-Testing (FOAT) and its Role in Reliability Physics of Electronic and Photonic Materials, Packages and Systems

E Suhir*

Bell Laboratories, Murray Hill, NJ (ret), Portland State University, Portland, OR, and ERS Co., Los Altos, CA, USA

*Corresponding Author: E Suhir, Bell Laboratories, Murray Hill, NJ (ret), Portland State University, Portland, OR, and ERS Co., Los Altos, CA, USA.

Received: December 21, 2022; Published: January 01, 2023

Abstract

An highly focused and highly cost effective failure-orientedaccelerated- testing (FOAT) [1] was suggested about a decade ago as an extension and a modification of highly accelerated life testing (HALT) [2] and as an experimental basis of the novel probabilistic design for reliability (PDfR) concept [3]. Such testing is intended to be carried out at the design stage of a new electronic, photonic, MEMS and MOEMS (optical MEMS) technology or a new design, when high operational reliability (like the one required, e.g., for aerospace, military, or long-haul communication applications) is a must. On the other hand, burn-in-testing (BIT).

References

  1. E Suhir. “Failure-Oriented-Accelerated-Testing (FOAT) and Its Role in Making a Viable IC Package into a Reliable Product”. Circuits Assembly, July (2013).
  2. E Suhir., et al. “Highly Accelerated Life Testing (HALT), Failure Oriented Accelerated Testing (FOAT), and Their Role in Making a Viable Device into a Reliable Product”. 2014 IEEE Aerospace Conference, Big Sky, Montana, March (2014).
  3. E Suhir. “Probabilistic Design for Reliability”. ChipScale Reviews6 (2010).
  4. E Suhir. “To Burn-in, or not to Burn-in: That’s the Question”. Aerospace3 (2019).
  5. E Suhir and S Kang. “Boltzmann-Arrhenius-Zhurkov (BAZ) Model in Physics-of-Materials Problems”. Modern Physics Letters B (MPLB) 27, April (2013).
  6. E Suhir. “Expected Lifetime of an Optical Silica Fiber Intended for Open Space Applications: Probabilistic Predictive Model”. Acta Astronautica 192, March (2022).
  7. E Suhir. “Analytical Thermal Stress Modeling in Electronic and Photonic Systems”. ASME Applied Mechanics Reviews4 (2009).
  8. E Suhir. “Physics of Failure of an Electronics Product Must Be Quantified to Assure the Product's Reliability”. Editorial, Acta Scientific Applied Physics1 (2021).

Citation

Citation: E Suhir. “Failure-Oriented-Accelerated-Testing (FOAT) and its Role in Reliability Physics of Electronic and Photonic Materials, Packages and Systems" Acta Scientific Applied Physics 3.2 (2023): 01-02.

Copyright

Copyright: © 2022 E Suhir. This is an open-access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.



News and Events


  • Certification for Review
    Acta Scientific certifies the Editors/reviewers for their review done towards the assigned articles of the respective journals.
  • Submission Timeline for Upcoming Issue
    The last date for submission of articles for regular Issues is December 25, 2024.
  • Publication Certificate
    Authors will be issued a "Publication Certificate" as a mark of appreciation for publishing their work.
  • Best Article of the Issue
    The Editors will elect one Best Article after each issue release. The authors of this article will be provided with a certificate of "Best Article of the Issue"

Contact US





//