E Suhir*
Bell Laboratories, Murray Hill, NJ (ret), Portland State University, Portland, OR, and ERS Co., Los Altos, CA, USA
*Corresponding Author: E Suhir, Bell Laboratories, Murray Hill, NJ (ret), Portland State University, Portland, OR, and ERS Co., Los Altos, CA, USA.
Received: December 21, 2022; Published: January 01, 2023
An highly focused and highly cost effective failure-orientedaccelerated- testing (FOAT) [1] was suggested about a decade ago as an extension and a modification of highly accelerated life testing (HALT) [2] and as an experimental basis of the novel probabilistic design for reliability (PDfR) concept [3]. Such testing is intended to be carried out at the design stage of a new electronic, photonic, MEMS and MOEMS (optical MEMS) technology or a new design, when high operational reliability (like the one required, e.g., for aerospace, military, or long-haul communication applications) is a must. On the other hand, burn-in-testing (BIT).
Citation: E Suhir. “Failure-Oriented-Accelerated-Testing (FOAT) and its Role in Reliability Physics of Electronic and Photonic Materials, Packages and Systems" Acta Scientific Applied Physics 3.2 (2023): 01-02.
Copyright: © 2022 E Suhir. This is an open-access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.