E Suhir*

Bell Laboratories, Murray Hill, NJ (ret), Portland State University, Portland, OR, and ERS Co., Los Altos, CA, USA

*Corresponding Author: E Suhir, Bell Laboratories, Murray Hill, NJ (ret), Portland State University, Portland, OR, and ERS Co., Los Altos, CA, USA.

Received: December 21, 2022; Published: January 01, 2023

Abstract

An highly focused and highly cost effective failure-orientedaccelerated- testing (FOAT) [1] was suggested about a decade ago as an extension and a modification of highly accelerated life testing (HALT) [2] and as an experimental basis of the novel probabilistic design for reliability (PDfR) concept [3]. Such testing is intended to be carried out at the design stage of a new electronic, photonic, MEMS and MOEMS (optical MEMS) technology or a new design, when high operational reliability (like the one required, e.g., for aerospace, military, or long-haul communication applications) is a must. On the other hand, burn-in-testing (BIT).

References

1. E Suhir. “Failure-Oriented-Accelerated-Testing (FOAT) and Its Role in Making a Viable IC Package into a Reliable Product”. Circuits Assembly, July (2013).
2. E Suhir., et al. “Highly Accelerated Life Testing (HALT), Failure Oriented Accelerated Testing (FOAT), and Their Role in Making a Viable Device into a Reliable Product”. 2014 IEEE Aerospace Conference, Big Sky, Montana, March (2014).
3. E Suhir. “Probabilistic Design for Reliability”. ChipScale Reviews6 (2010).
4. E Suhir. “To Burn-in, or not to Burn-in: That’s the Question”. Aerospace3 (2019).
5. E Suhir and S Kang. “Boltzmann-Arrhenius-Zhurkov (BAZ) Model in Physics-of-Materials Problems”. Modern Physics Letters B (MPLB) 27, April (2013).
6. E Suhir. “Expected Lifetime of an Optical Silica Fiber Intended for Open Space Applications: Probabilistic Predictive Model”. Acta Astronautica 192, March (2022).
7. E Suhir. “Analytical Thermal Stress Modeling in Electronic and Photonic Systems”. ASME Applied Mechanics Reviews4 (2009).
8. E Suhir. “Physics of Failure of an Electronics Product Must Be Quantified to Assure the Product's Reliability”. Editorial, Acta Scientific Applied Physics1 (2021).

Citation

Citation: E Suhir. “Failure-Oriented-Accelerated-Testing (FOAT) and its Role in Reliability Physics of Electronic and Photonic Materials, Packages and Systems" Acta Scientific Applied Physics 3.2 (2023): 01-02.

Copyright

Copyright: © 2022 E Suhir. This is an open-access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.