Acta Scientific Applied Physics

Review Article Volume 2 Issue 12

Surface Morphology of Polymers Examined by Atomic Force Microscopy

Péricles Lopes Santana*, José Roberto R Bortoleto, Nilson Cristino da Cruz, Elidiane Cipriano Rangel and Steven F Durrant

Universidade Estadual Paulista – UNESP Laboratorio de Plasmas Tecnologicos, Sorocaba, SP, Brasil

*Corresponding Author: Péricles Lopes Santana, Universidade Estadual Paulista – UNESP Laboratorio de Plasmas Tecnologicos, Sorocaba, SP, Brasil.

Received: September 09, 2022; Published: November 07, 2022


In this article we introduce some studies of surface morphology in polyolefins, including commercial polymers. Atomic Force Microscopy (AFM) was used to examine the surface roughness of the pristine and plasma-treated samples. A polymer surface in a plasma is exposed to a broad spectrum of ions, electrons and radicals, which cause sputtering and etching and, consequently, increases surface roughness and induce changes in surface chemistry. Today, AFM, is one of the foremost tools for imaging, measuring and manipulating the surface of materials at the nanoscale, being useful in diverse areas such as materials and life science and in engineering, revealing surface roughness, RRMS above 1 nm and below 100 nm for the polymers examined by an Atomic Force Microscope at non contact mode.

Keywords: Polymers; Surface Morphology; AFM


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Citation: Péricles Lopes Santana., et al. “Surface Morphology of Polymers Examined by Atomic Force Microscopy". Acta Scientific Applied Physics 2.12 (2022): 04-20.


Copyright: © 2022 Péricles Lopes Santana., et al. This is an open-access article distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited.

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